Transmission-Line Pulse ESD Testing of ICs: A New Beginning
نویسندگان
چکیده
The integrated circuit (IC) industry has been using transmission-line pulse (TLP) testing to characterize on-chip electrostatic discharge (ESD) protection structures since 1985. This TLP ESD testing technique was introduced by Maloney and Khurana as a new electrical analysis tool to test the many single elements used as ESD protection structures. Since then, the technique has been shown to be most useful as a means for reducing the design cycle time for these protection circuits. A TLP tester employs a rectangular pulse with energy ranges similar to those used in human body model (HBM) ESD qualification testing. The pulse width of the TLP is
منابع مشابه
Transmission Line Pulse Testing of the ESD Protection Structures of ICs.- A Failure Analysts Perspective
The IC industry continues to find ways to improve the ability to correlate the electrical failure signature of devices with the physical failure location using different techniques. The purpose of this work is to show that improved transmission line pulse (TLP) testing technique of ESD (ElectroStatic Discharge) protection structures can provide accurate identification of leakage current to bett...
متن کاملOn-Chip ESD Protection Design by Using Polysilicon Diodes in CMOS Process
A novel on-chip electrostatic discharge (ESD) protection design by using polysilicon diodes as the ESD clamp devices in CMOS process is first proposed in this paper. Different process splits have been experimentally evaluated to find the suitable doping concentration for optimizing the polysilicon diodes for both on-chip ESD protection design and the application requirements of the smart-card I...
متن کاملSimulation of the Cross-Coupling among Snap Back Devices under Transient High Current Stress
A main issue for on-chip protection of Smart Power ICs against ESD and other transient high current pulses is the cross-coupling between the protection device (PD) and the device to be protected. In many cases both are npn transistors (e.g. parasitic of DMOS), therefore we investigate the coupled triggering of such devices by numerical device simulations. We show that even considering the separ...
متن کاملPractical Evaluation of ESD Protection Devices for High-speed Interface
In this paper, three types of ESD protection devices with low capacitance used for high-speed interfaces are evaluated by transmission line pulse measurement. Different suppression characteristics were observed for rise time and pulse width. The results suggest there could be some differences in practical system-level ESD tests among ESD protection devices. An ESD gun test confirms this, and po...
متن کاملDesign of Novel SCR-based ESD Protection Device for I/O Clamp in BCD Process
In this paper, a novel LVTSCR-based device for electrostatic discharge (ESD) protection of integrated circuits (ICs) is designed, fabricated and characterized. The proposed device is similar to the conventional LVTSCR but it has an embedded PMOSFET in the anode n-well to enhance the turn on speed, the clamping capability and the robustness. This is possible because the embedded PMOSFET provides...
متن کامل